| 1 | Reliability studies of electronic devices poerating under environmental stresses |
| Researcher: | Krishan Lal |
| Guide: | Yadav, R P S |
| University: | Ch Charan Singh University |
| Language: | English |
| 2 | Effects of process variations on the performance parameters of VLSI interconnects |
| Researcher: | Verma, K G |
| Guide: | Singh, RaghuvirKaushik, B K |
| University: | Shobhit University |
| Language: | English |
| 3 | Contributions to the study and applications of transistor multivibrator operatiors |
| Researcher: | Mahesh Chandra |
| Guide: | Singh, B RRam Prasad |
| University: | Ch Charan Singh University |
| Language: | English |