| Type of Material: | Thesis |
| Title: | Reliability studies of electronic devices poerating under environmental stresses |
| Researcher: | Krishan Lal |
| Guide: | Yadav, R P S |
| Department: | Department of Physics |
| Publisher: | Ch Charan Singh University |
| Place: | Meerut |
| Year: | 1980 |
| Language: | English |
| Subject: | Engineering | Electronics Engineering | Physics |
| Dissertation/Thesis Note: | PhD |
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| 003 | IN-AhILN | |
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| 245 | __ | |aReliability studies of electronic devices poerating under environmental stresses |
| 260 | __ | |aMeerut|bCh Charan Singh University|c1980 |
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| 650 | __ | |aPhysics|2UGC |
| 653 | __ | |aEngineering |
| 653 | __ | |aElectronics Engineering |
| 700 | __ | |aYadav, R P S|eGuide |
| 905 | __ | |anotification |
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