Title : Effects of process variations on the performance parameters of VLSI interconnects

Type of Material: Thesis
Title: Effects of process variations on the performance parameters of VLSI interconnects
Researcher: Verma, K G
Guide: Singh, Raghuvir
Kaushik, B K
Department: Department of Electronics
Publisher: Shobhit University
Place: Meerut
Year: 2012
Language: English
Subject: Electronics
Electronic engineering
VLSI interconnects
Dissertation/Thesis Note: PhD

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035__|a(IN-AhILN)th_252738
040__|aSHOB_250110|dIN-AhILN
041__|aeng
100__|aVerma, K G|eResearcher
110__|aDepartment of Electronics|bShobhit University|dMeerut
245__|aEffects of process variations on the performance parameters of VLSI interconnects
260__|aMeerut|bShobhit University|c2012
502__|bPhD
653__|aElectronics
653__|aElectronic engineering
653__|aVLSI interconnects
700__|aSingh, Raghuvir|eGuide
700__|aKaushik, B K|eGuide
905__|anotification

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