| 1 | Reliability studies of electronic devices poerating under environmental stresses |
| Researcher: | Krishan Lal |
| Guide: | Yadav, R P S |
| University: | Ch Charan Singh University |
| Language: | English |
| 2 | |
| Researcher: | Khurana, Vikash |
| Guide: | Yadav, R P S |
| University: | Mahatma Jyotiba Phule Rohilkhand University |
| Language: | English |