| 1 | Design for testability and faults analysis in PLAs and general combinational circuits |
| Researcher: | Jacob, James |
| Guide: | Biswas, N NSatyam, M |
| University: | Indian Institute of Science |
| Language: | English |
| 2 | |
| Researcher: | Jacob, James |
| Guide: | Udayakumar, M |
| University: | University of Agricultural Sciences |
| Language: | English |
| 3 | |
| Researcher: | Jacob, James N |
| Guide: | Bhattacharyya, P K |
| University: | Indian Institute of Science |
| Language: | English |