| Type of Material: | Thesis |
| Title: | Design for testability and faults analysis in PLAs and general combinational circuits |
| Researcher: | Jacob, James |
| Guide: | Biswas, N N | Satyam, M |
| Department: | Department of Electrical Communication Engineering |
| Publisher: | Indian Institute of Science |
| Place: | Bangalore |
| Year: | 1988 |
| Language: | English |
| Subject: | Engineering | Electronics Engineering | Computer | Circuitry |
| Dissertation/Thesis Note: | PhD |
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| 100 | __ | |aJacob, James|eResearcher |
| 110 | __ | |aDepartment of Electrical Communication Engineering|bIndian Institute of Science|dBangalore|eIn |
| 245 | __ | |aDesign for testability and faults analysis in PLAs and general combinational circuits |
| 260 | __ | |aBangalore|bIndian Institute of Science|c1988 |
| 502 | __ | |bPhD |
| 653 | __ | |aEngineering |
| 653 | __ | |aElectronics Engineering |
| 653 | __ | |aComputer |
| 653 | __ | |aCircuitry |
| 700 | __ | |aBiswas, N N|eGuide |
| 700 | __ | |aSatyam, M|eGuide |
| 905 | __ | |anotification |
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