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1

Analysis of potential and stress in metal insulator-semiconductor insulator metal structures

Researcher:Apte, Prakash Ramchandra
Guide:Ramanathan, K V
University:Tata Institute of Fundamental Research
Language:English
2

Charge trapping in SiO2 and Si-SiO2 interface state generation due to avalanche carrier injection in MoS devices

Researcher:Vishnubhala, Lashmanna
Guide:Vijayaraghavan, R
University:Tata Institute of Fundamental Research
Language:English