| Type of Material: | Thesis |
| Title: | Charge trapping in SiO2 and Si-SiO2 interface state generation due to avalanche carrier injection in MoS devices |
| Researcher: | Vishnubhala, Lashmanna |
| Guide: | Vijayaraghavan, R |
| Department: | Department of Physics |
| Publisher: | Tata Institute of Fundamental Research |
| Place: | Mumbai |
| Year: | 1988 |
| Language: | English |
| Subject: | Physics | Electronics | Electrodynamics | Conduction and Resistance | Semi Conductor | Physics |
| Dissertation/Thesis Note: | PhD |
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