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1

On the inadmissible class of faulty functions in logic networks and design for testability in LSI/VLSI

Researcher:Bhattacharyya, Bhargabhikram
University:University of Calcutta
Language:English
2

On the design of easily testable logic networks for detection of stuck-at and bridging faults

Researcher:Gupta, Bidyut
University:University of Calcutta
Language:English