Title : On the design of easily testable logic networks for detection of stuck-at and bridging faults

Type of Material: Thesis
Title: On the design of easily testable logic networks for detection of stuck-at and bridging faults
Researcher: Gupta, Bidyut
Department: Department of Electronics Engineering
Publisher: University of Calcutta
Place: Calcutta
Year: 1986
Language: English
Subject: Engineering
Electronics Engineering
Computer
Computer Theory
Dissertation/Thesis Note: PhD

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008__861231t1986||||ii#||||g|m||||||||||eng||
035__|a(IN-AhILN)th_137383
040__|aCLCT_700073|dIN-AhILN
041__|aeng
100__|aGupta, Bidyut|eResearcher
110__|aDepartment of Electronics Engineering|bUniversity of Calcutta|dCalcutta|eIn
245__|aOn the design of easily testable logic networks for detection of stuck-at and bridging faults
260__|aCalcutta|bUniversity of Calcutta|c1986
502__|bPhD
653__|aEngineering
653__|aElectronics Engineering
653__|aComputer
653__|aComputer Theory
905__|anotification

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