| 1 | |
| Researcher: | Sabhnani, Nandkumar Hariram |
| Guide: | Rao, B V |
| University: | Indian Institute of Technology-Bombay |
| Language: | English |
| 2 | Studies in testing of transistor stuck open faults in combunational CMOS circuits |
| Researcher: | Sherlekar, Sunil Dattatraya |
| Guide: | Vogi, J |
| University: | Indian Institute of Technology-bombay |
| Language: | English |
| 3 | |
| Researcher: | Abdul Karim, Abdul Bashir |
| Guide: | Revankar, G N |
| University: | Indian Institute of Technology-bombay |
| Language: | English |
| 4 | |
| Researcher: | Singh, Deep Narayan |
| Guide: | Rao, B VSitaram, R V S |
| University: | Indian Institute of Technology-bombay |
| Language: | English |