| Type of Material: | Thesis |
| Title: | Studies in testing of transistor stuck open faults in combunational CMOS circuits |
| Researcher: | Sherlekar, Sunil Dattatraya |
| Guide: | Vogi, J |
| Department: | Department of Electronics Engineering |
| Publisher: | Indian Institute of Technology-bombay |
| Place: | Mumbai |
| Year: | 1988 |
| Language: | English |
| Subject: | Engineering | Electronics Engineering | Short and Long Wave Electronics | Circuits |
| Dissertation/Thesis Note: | PhD |
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| 001 | 71921 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
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| 100 | __ | |aSherlekar, Sunil Dattatraya|eResearcher |
| 110 | __ | |aDepartment of Electronics Engineering|bIndian Institute of Technology-bombay|dMumbai|eIn |
| 245 | __ | |aStudies in testing of transistor stuck open faults in combunational CMOS circuits |
| 260 | __ | |aMumbai|bIndian Institute of Technology-bombay|c1988 |
| 502 | __ | |bPhD |
| 653 | __ | |aEngineering |
| 653 | __ | |aElectronics Engineering |
| 653 | __ | |aShort and Long Wave Electronics |
| 653 | __ | |aCircuits |
| 700 | __ | |aVogi, J|eGuide |
| 905 | __ | |anotification |
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