| 1 | Design for testability and faults analysis in PLAs and general combinational circuits |
| Researcher: | Jacob, James |
| Guide: | Biswas, N NSatyam, M |
| University: | Indian Institute of Science |
| Language: | English |
| 2 | |
| Researcher: | Ghantala, Girija |
| Guide: | Asnare, K L |
| University: | Rashtrasant Tukadoji Maharaj Nagpur University |
| Language: | English |