| 1 | Design for testability and faults analysis in PLAs and general combinational circuits |
| Researcher: | Jacob, James |
| Guide: | Biswas, N NSatyam, M |
| University: | Indian Institute of Science |
| Language: | English |
| 2 | |
| Researcher: | James, V G |
| Guide: | Sathe, S P |
| University: | University of Pune |
| Language: | English |