| Type of Material: | Thesis |
| Title: | Effect of X-ray radiation and high field stress on MOS Capacitors |
| Researcher: | Tolpadi, Amita |
| Department: | Department of Physics |
| Publisher: | Banaras Hindu University |
| Place: | Varanasi |
| Year: | 1990 |
| Language: | English |
| Subject: | Physics | X ray | Physics |
| Accession No: | 788912%789570 |
| Dissertation/Thesis Note: | PhD |
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| 001 | 90723 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 901231t1990||||ii#||||g|m||||||||||eng|| |
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| 040 | __ | |aBHUL_221005|dIN-AhILN |
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| 100 | __ | |aTolpadi, Amita|eResearcher |
| 110 | __ | |aDepartment of Physics|bBanaras Hindu University|dVaranasi|eIN |
| 245 | __ | |aEffect of X-ray radiation and high field stress on MOS Capacitors |
| 260 | __ | |aVaranasi|bBanaras Hindu University|c1990 |
| 502 | __ | |bPhD |
| 650 | __ | |aPhysics|2UGC |
| 653 | __ | |aPhysics |
| 653 | __ | |aX ray |
| 852 | __ | |p788912%789570 |
| 905 | __ | |anotification |
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