Title : Ellipsometric studies of some structural aspects of amorphous Si, Ge and Ge-se films

Type of Material: Thesis
Title: Ellipsometric studies of some structural aspects of amorphous Si, Ge and Ge-se films
Researcher: Kumar, Satyendra
Guide: Pandya, D K
Department: Department of Physics
Publisher: Indian Institute of Technology-Delhi
Place: New Delhi
Year: 1987
Language: English
Subject: Physics
States of Matter
Solid State
Physics
Dissertation/Thesis Note: PhD

00000000ntm a2200000ua 4500
00182521
003IN-AhILN
0052011-01-13 00:00:00
008__871231t1987||||ii#||||g|m||||||||||eng||
035__|a(IN-AhILN)th_82521
040__|aIITD_110016|dIN-AhILN
041__|aeng
100__|aKumar, Satyendra|eResearcher
110__|aDepartment of Physics|bIndian Institute of Technology-Delhi|dNew Delhi|eIn
245__|aEllipsometric studies of some structural aspects of amorphous Si, Ge and Ge-se films
260__|aNew Delhi|bIndian Institute of Technology-Delhi|c1987
502__|bPhD
650__|aPhysics|2UGC
653__|aPhysics
653__|aStates of Matter
653__|aSolid State
700__|aPandya, D K|eGuide
905__|anotification

User Feedback Comes Under This section.