Title : Studies on thickness dependence of density of states distribution in a Si:H thin films

Type of Material: Thesis
Title: Studies on thickness dependence of density of states distribution in a Si:H thin films
Researcher: Sridhar, R
Guide: Majhi, J
Department: Department of Physics
Publisher: Indian Institute of Technology-madras
Place: Chennai
Year: 1990
Language: English
Subject: Physics
Solid State
Physics
Dissertation/Thesis Note: PhD

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035__|a(IN-AhILN)th_82100
040__|aIITM_600036|dIN-AhILN
041__|aeng
100__|aSridhar, R|eResearcher
110__|aDepartment of Physics|bIndian Institute of Technology-madras|dChennai|eIn
245__|aStudies on thickness dependence of density of states distribution in a Si:H thin films
260__|aChennai|bIndian Institute of Technology-madras|c1990
502__|bPhD
650__|aPhysics|2UGC
653__|aPhysics
653__|aSolid State
700__|aMajhi, J|eGuide
905__|anotification

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