| Type of Material: | Thesis |
| Title: | Studies on the degradation of tin oxide-silicon interfaces |
| Researcher: | Raychaudhuri, Uma |
| Guide: | Satyam, M |
| Department: | Department of Electrical Communication Engineering |
| Publisher: | Indian Institute of Science |
| Place: | Bangalore |
| Year: | 1989 |
| Language: | English |
| Subject: | Engineering | Electronics Engineering | Computer |
| Dissertation/Thesis Note: | PhD |
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