| Type of Material: | Thesis |
| Title: | Test pattern generation for vlsi circuits |
| Researcher: | Sharma, Gopal Krishan |
| Guide: | Agrawal, R P | Gupta, J P | Sarkar, S | Ahmad, S |
| Department: | Department of Electronics |
| Publisher: | University of Roorkee |
| Place: | Roorkee |
| Year: | 1997 |
| Language: | English |
| Subject: | Vlsi Circuits |
| Dissertation/Thesis Note: | PhD |
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| 001 | 65934 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
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| 041 | __ | |aeng |
| 100 | __ | |aSharma, Gopal Krishan|eResearcher |
| 110 | __ | |aDepartment of Electronics|bUniversity of Roorkee|dRoorkee|eIN |
| 245 | __ | |aTest pattern generation for vlsi circuits |
| 260 | __ | |aRoorkee|bUniversity of Roorkee|c1997 |
| 502 | __ | |bPhD |
| 653 | __ | |aVlsi Circuits |
| 700 | __ | |aAgrawal, R P|eGuide |
| 700 | __ | |aGupta, J P|eGuide |
| 700 | __ | |aSarkar, S|eGuide |
| 700 | __ | |aAhmad, S|eGuide |
| 905 | __ | |anotification |
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