Title : Test pattern generation for vlsi circuits

Type of Material: Thesis
Title: Test pattern generation for vlsi circuits
Researcher: Sharma, Gopal Krishan
Guide: Agrawal, R P
Gupta, J P
Sarkar, S
Ahmad, S
Department: Department of Electronics
Publisher: University of Roorkee
Place: Roorkee
Year: 1997
Language: English
Subject: Vlsi Circuits
Dissertation/Thesis Note: PhD

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