| Type of Material: | Thesis |
| Title: | Growth and evaluation of dielectric layers for fabricating thin-filmRC structures. |
| Researcher: | Ahmad, Shamim |
| Guide: | Singh, Raghuvir |
| Department: | Department of |
| Publisher: | University of Roorkee |
| Place: | Roorkee |
| Year: | 1982 |
| Language: | Japanese |
| Subject: | Dielectric Layers |
| Dissertation/Thesis Note: | PhD |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 65338 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 821231t1982||||ii#||||g|m||||||||||jpn|| |
| 035 | __ | |a(IN-AhILN)th_65338 |
| 040 | __ | |aROOR_247667|dIN-AhILN |
| 041 | __ | |ajpn |
| 100 | __ | |aAhmad, Shamim|eResearcher |
| 110 | __ | |aDepartment of|bUniversity of Roorkee|dRoorkee|eIN |
| 245 | __ | |aGrowth and evaluation of dielectric layers for fabricating thin-filmRC structures. |
| 260 | __ | |aRoorkee|bUniversity of Roorkee|c1982 |
| 502 | __ | |bPhD |
| 653 | __ | |aDielectric Layers |
| 700 | __ | |aSingh, Raghuvir|eGuide |
| 905 | __ | |anotification |
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