| Type of Material: | Thesis |
| Title: | On a design approach for reducing aliasing errors and achieving higher testability goals in LFSR based testing of combinational circuits |
| Researcher: | Ahmad, Afaq |
| Guide: | Nanda, N K | Garg, K |
| Department: | Department of Electricals |
| Publisher: | University of Roorkee |
| Place: | Roorkee |
| Year: | 1989 |
| Language: | English |
| Subject: | Combinational Circuits |
| Dissertation/Thesis Note: | PhD |
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| 001 | 65306 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
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| 040 | __ | |aROOR_247667|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aAhmad, Afaq|eResearcher |
| 110 | __ | |aDepartment of Electricals|bUniversity of Roorkee|dRoorkee|eIN |
| 245 | __ | |aOn a design approach for reducing aliasing errors and achieving higher testability goals in LFSR based testing of combinational circuits |
| 260 | __ | |aRoorkee|bUniversity of Roorkee|c1989 |
| 502 | __ | |bPhD |
| 653 | __ | |aCombinational Circuits |
| 700 | __ | |aNanda, N K|eGuide |
| 700 | __ | |aGarg, K|eGuide |
| 905 | __ | |anotification |
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