Title : effect of built-in drift fields, emitter recombinations, back surface recombinations and high injection on open circuit voltage decay

Type of Material: Thesis
Title: effect of built-in drift fields, emitter recombinations, back surface recombinations and high injection on open circuit voltage decay
Researcher: Ray, Uday Chand
Guide: Jain, S C
Kundu, P
Department: Department of Electrical Engineering
Publisher: University of Delhi
Place: New Delhi
Year: 1991
Language: English
Subject: Engineering
Electrical Engineering
Analysis
Control
Compensation
Linear Induction Motor
Electrical Engineering
Dissertation/Thesis Note: PhD

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035__|a(IN-AhILN)th_6263
040__|aDELI_110007|dIN-AhILN
041__|aeng
100__|aRay, Uday Chand|eResearcher
110__|aDepartment of Electrical Engineering|bUniversity of Delhi|dNew Delhi|eIn
245__|aeffect of built-in drift fields, emitter recombinations, back surface recombinations and high injection on open circuit voltage decay
260__|aNew Delhi|bUniversity of Delhi|c1991
502__|bPhD
650__|2UGC|aElectrical Engineering
653__|aEngineering
653__|aElectrical Engineering
653__|aAnalysis
653__|aControl
653__|aCompensation
653__|aLinear Induction Motor
700__|aJain, S C|eGuide
700__|aKundu, P|eGuide
905__|anotification

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