| Type of Material: | Thesis |
| Title: | Ion beam characterisation and engineering of strain in semiconductor multi layers |
| Researcher: | Rao, Nageshwar |
| Guide: | Pathak, A P |
| Department: | Department of Physics |
| Publisher: | University of Hyderabad |
| Place: | Hyderabad |
| Year: | 2003 |
| Language: | English |
| Subject: | Physical Sciences | Physics | Physics |
| Accession No: | Vol 41 Issue 29 |
| Dissertation/Thesis Note: | PhD |
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| 001 | 50488 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
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| 100 | __ | |aRao, Nageshwar|eResearcher |
| 110 | __ | |aDepartment of Physics|bUniversity of Hyderabad|dHyderabad|eIn |
| 245 | __ | |aIon beam characterisation and engineering of strain in semiconductor multi layers |
| 260 | __ | |aHyderabad|bUniversity of Hyderabad|c2003 |
| 502 | __ | |bPhD |
| 650 | __ | |aPhysics|2UGC |
| 653 | __ | |aPhysical Sciences |
| 653 | __ | |aPhysics |
| 700 | __ | |aPathak, A P|eGuide |
| 852 | __ | |pVol 41 Issue 29 |
| 905 | __ | |anotification |
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