Title : Effect of X-ray radiation and high field stress on Mos capacitors

Type of Material: Thesis
Title: Effect of X-ray radiation and high field stress on Mos capacitors
Researcher: Tolpadi, Amita
Guide: Srivastava, R S
Department: Department of Physics
Publisher: Banaras Hindu University
Place: Varanasi
Year: 1991
Language: English
Subject: Physics
Electronics
X Rays
Mos Capacitors
Physics
Dissertation/Thesis Note: PhD

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035__|a(IN-AhILN)th_4988
040__|aBHUL_221005|dIN-AhILN
041__|aeng
100__|aTolpadi, Amita|eResearcher
110__|aDepartment of Physics|bBanaras Hindu University|dVaranasi|eIn
245__|aEffect of X-ray radiation and high field stress on Mos capacitors
260__|aVaranasi|bBanaras Hindu University|c1991
502__|bPhD
650__|aPhysics|2UGC
653__|aPhysics
653__|aElectronics
653__|aX Rays
653__|aMos Capacitors
700__|aSrivastava, R S|eGuide
905__|anotification

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