Type of Material: | Thesis |
Title: | Effect of X-ray radiation and high field stress on Mos capacitors |
Researcher: | Tolpadi, Amita |
Guide: | Srivastava, R S |
Department: | Department of Physics |
Publisher: | Banaras Hindu University |
Place: | Varanasi |
Year: | 1991 |
Language: | English |
Subject: | Physics | Electronics | X Rays | Mos Capacitors | Physics |
Dissertation/Thesis Note: | PhD |
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