| Type of Material: | Thesis |
| Title: | Interface trap effects and noise dynamics in n-p-n double gate TFETs under low power considerations |
| Researcher: | Deb, Deepjyoti |
| Guide: | Goswami, Rupam | Baruah, Ratul Kumar  |
| Department: | Department of Electronics and Communication Engineering |
| Publisher: | Tezpur University, Tezpur |
| Place: | Tezpur |
| Year: | 2026 |
| Language: | English |
| Subject: | Electronics | Electronics and Communication Engineering | Engineering and Technology |
| Dissertation/Thesis Note: | PhD; Department of Electronics and Communication Engineering, Tezpur University, Tezpur, Tezpur; 2026; ECP21104 |
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| 001 | 460035 | |
| 003 | IN-AhILN | |
| 005 | 2026-05-26 10:31:56 | |
| 008 | __ | 260526t2026||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_460035 |
| 040 | __ | |dIN-AhILN|aTEZU_784025 |
| 041 | __ | |aeng |
| 100 | __ | |eResearcher|aDeb, Deepjyoti |
| 110 | __ | |aDepartment of Electronics and Communication Engineering|0U-0056|dTezpur|bTezpur University, Tezpur|ein |
| 245 | __ | |aInterface trap effects and noise dynamics in n-p-n double gate TFETs under low power considerations |
| 260 | __ | |aTezpur|c2026|bTezpur University, Tezpur |
| 502 | __ | |bPhD|oECP21104|d2026|cDepartment of Electronics and Communication Engineering, Tezpur University, Tezpur, Tezpur |
| 518 | __ | |oDate of Notification|d2026-05-15 |
| 650 | __ | |aElectronics and Communication Engineering|2UGC |
| 650 | __ | |aEngineering and Technology|2AIU |
| 653 | __ | |aElectronics |
| 700 | __ | |aGoswami, Rupam|eGuide |
| 700 | __ | |aBaruah, Ratul Kumar|eGuide|0(Vidwan)https://vidwan.inflibnet.ac.in/profile/116498 |
| 905 | __ | |anotification |
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