Title : Ion Beam Studies of Pure and Nanoparticle Si Ag Embedded HfO2 Thin Films

Type of Material: Thesis
Title: Ion Beam Studies of Pure and Nanoparticle Si Ag Embedded HfO2 Thin Films
Researcher: Dhanunjaya ,Munthala
Guide: Rao ,S. V. S. Nageswara and Pathak A. P.
Department: School of Physics
Publisher: University of Hyderabad, Hyderabad
Place: Hyderabad
Year: 2018
Language: English
Subject: Embedded computer systems
Nanoparticles
Physical Sciences
Physics
Physics Applied
Physics
Physical and Basic Sciences
Dissertation/Thesis Note: PhD; School of Physics, University of Hyderabad, Hyderabad, Hyderabad
Fulltext: Shodhganga

00000000ntm a2200000ua 4500
001448464
003IN-AhILN
0052023-07-21 11:53:53
008__230721t2018||||ii#||||g|m||||||||||eng||
035__|a(IN-AhILN)th_448464
040__|aHYDR_500046|dIN-AhILN
041__|aeng
100__|aDhanunjaya ,Munthala|eResearcher
110__|aSchool of Physics|bUniversity of Hyderabad, Hyderabad|dHyderabad|ein
245__|aIon Beam Studies of Pure and Nanoparticle Si Ag Embedded HfO2 Thin Films
260__|aHyderabad|bUniversity of Hyderabad, Hyderabad|c2018
300__|a147p.|dDVD|c-
502__|bPhD|cSchool of Physics, University of Hyderabad, Hyderabad, Hyderabad
650__|aPhysics|2UGC
650__|aPhysical and Basic Sciences|2AIU
653__|aEmbedded computer systems
653__|aNanoparticles
653__|aPhysical Sciences
653__|aPhysics
653__|aPhysics Applied
700__|aRao ,S. V. S. Nageswara and Pathak A. P.|eGuide
856__|uhttp://shodhganga.inflibnet.ac.in/handle/10603/408399|yShodhganga
905__|afromsg

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