| Researcher: | Kaibartta, Tanusree |
| Guide: | Biswas, G.P. | Pal, Arup Kumar | Das, Debesh Kumar |
| Subject: | Some test | Strategies | 3D integrated circuits |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 445748 | |
| 003 | IN-AhILN | |
| 005 | 2023-01-23 17:03:15 | |
| 008 | __ | 230123t2022||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_445748 |
| 040 | __ | |aISMD_826004|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aKaibartta, Tanusree|eResearcher |
| 110 | __ | |aDepartment of Computer Science and Engineering|bIndian School of Mines, Dhanbad|dDhanbad |
| 245 | __ | |aSome test strategies for 3D integrated circuits |
| 260 | __ | |aDhanbad|bIndian School of Mines, Dhanbad|c2022 |
| 502 | __ | |bPhD |
| 653 | __ | |aSome test |
| 653 | __ | |aStrategies |
| 653 | __ | |a3D integrated circuits |
| 700 | __ | |aBiswas, G.P.|eGuide |
| 700 | __ | |aPal, Arup Kumar|eGuide |
| 700 | __ | |aDas, Debesh Kumar|eGuide |
| 905 | __ | |anotification |
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