Title : Reliability analysis of advanced nano MOS devices for analog and RF applications

Type of Material: Thesis
Title: Reliability analysis of advanced nano MOS devices for analog and RF applications
Researcher: Dutta, Arka
Guide: Sarkar, Chandan Kumar and Saha
Publisher: Jadavpur University
Place: Kolkata
Language: English
Dissertation/Thesis Note: PhD
Fulltext: Shodhganga

00000000ntm a2200000ua 4500
001435545
003IN-AhILN
0052018-08-15 01:37:16
008__180815t####||||ii#||||g|m||||||||||eng||
035__|a(IN-AhILN)th_435545
040__|aJDVP_700032|dIN-AhILN
041__|aeng
100__|aDutta, Arka|eResearcher
245__|aReliability analysis of advanced nano MOS devices for analog and RF applications
260__|aKolkata|bJadavpur University
502__|bPhD
700__|aSarkar, Chandan Kumar and Saha|eGuide
856__|uhttp://shodhganga.inflibnet.ac.in/handle/10603/207749|yShodhganga
905__|anotification

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