| Type of Material: | Thesis |
| Title: | Analysis of low power high fault coverage testing for sequential circuits |
| Researcher: | M, Thoulath Begam V |
| Guide: | Baulkani, S |
| Publisher: | Anna University |
| Place: | Chennai |
| Dissertation/Thesis Note: | PhD |
| Fulltext: | Shodhganga |
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| 001 | 425925 | |
| 003 | IN-AhILN | |
| 005 | 2018-08-15 12:49:19 | |
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| 100 | __ | |aM, Thoulath Begam V|eResearcher |
| 245 | __ | |aAnalysis of low power high fault coverage testing for sequential circuits |
| 260 | __ | |aChennai|bAnna University |
| 502 | __ | |bPhD |
| 700 | __ | |aBaulkani, S|eGuide |
| 856 | __ | |uhttp://shodhganga.inflibnet.ac.in/handle/10603/196227|yShodhganga |
| 905 | __ | |anotification |
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