Title : Hierarchical evolution of digital arithmetic circuits with built in self test logic for delay faults

Type of Material: Thesis
Title: Hierarchical evolution of digital arithmetic circuits with built in self test logic for delay faults
Researcher: V P Kolanchinathan
Publisher: St. Peters University
Place: Chennai
Language: English
Dissertation/Thesis Note: PhD
Fulltext: Shodhganga

00000000ntm a2200000ua 4500
001413119
003IN-AhILN
0052018-08-14 11:44:04
008__180814t####||||ii#||||g|m||||||||||eng||
035__|a(IN-AhILN)th_413119
040__|aSTPU_600054|dIN-AhILN
041__|aeng
100__|aV P Kolanchinathan|eResearcher
245__|aHierarchical evolution of digital arithmetic circuits with built in self test logic for delay faults
260__|aChennai|bSt. Peters University
502__|bPhD
856__|uhttp://shodhganga.inflibnet.ac.in/handle/10603/180775|yShodhganga
905__|anotification

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