Title : Ultrathin diffusion barrier layers for copper metallization in silicon based integrated circuits

Type of Material: Thesis
Title: Ultrathin diffusion barrier layers for copper metallization in silicon based integrated circuits
Researcher: Sharma, Sumit
Guide: Dinesh Kumar
Publisher: Kurukshetra University
Place: Kurukshetra
Language: English
Dissertation/Thesis Note: PhD
Fulltext: Shodhganga

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035__|a(IN-AhILN)th_389167
040__|aKRKT_132119|dIN-AhILN
041__|aeng
100__|aSharma, Sumit|eResearcher
245__|aUltrathin diffusion barrier layers for copper metallization in silicon based integrated circuits
260__|aKurukshetra|bKurukshetra University
502__|bPhD
700__|aDinesh Kumar|eGuide
856__|uhttp://shodhganga.inflibnet.ac.in/handle/10603/151815|yShodhganga
905__|anotification

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