| Type of Material: | Thesis |
| Title: | Development of Thermally Stimulated Exoelectron Emission _TSEE_ technique for the detection and characterisation of surface and interface defects in silicon _Si_ and gallium arsenide _GaAs_ |
| Researcher: | Railkar, Tarak A |
| Guide: | Bhoraskar, S V |
| Publisher: | Savitribai Phule Pune University |
| Place: | Pune |
| Language: | English |
| Dissertation/Thesis Note: | PhD |
| Fulltext: | Shodhganga |
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| 001 | 379101 | |
| 003 | IN-AhILN | |
| 005 | 2018-08-14 08:43:00 | |
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| 041 | __ | |aeng |
| 100 | __ | |aRailkar, Tarak A|eResearcher |
| 245 | __ | |aDevelopment of Thermally Stimulated Exoelectron Emission _TSEE_ technique for the detection and characterisation of surface and interface defects in silicon _Si_ and gallium arsenide _GaAs_ |
| 260 | __ | |aPune|bSavitribai Phule Pune University |
| 502 | __ | |bPhD |
| 700 | __ | |aBhoraskar, S V|eGuide |
| 856 | __ | |uhttp://shodhganga.inflibnet.ac.in/handle/10603/140226|yShodhganga |
| 905 | __ | |anotification |
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