| Type of Material: | Thesis |
| Title: | Studies on structure and imperfections of SiC crstals by X-ray diffraction and electron microscopic techniques |
| Researcher: | Rai, Raghaw Sharan |
| Guide: | Singh, G |
| Department: | Department of Physics |
| Publisher: | Banaras Hindu University |
| Place: | Varanasi |
| Year: | 1982 |
| Language: | English |
| Subject: | Physics | Crystallography | Diffraction Methods | Physics |
| Dissertation/Thesis Note: | PhD |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 36312 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 821231t1982||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_36312 |
| 040 | __ | |aBHUL_221005|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aRai, Raghaw Sharan|eResearcher |
| 110 | __ | |aDepartment of Physics|bBanaras Hindu University|dVaranasi|eIn |
| 245 | __ | |aStudies on structure and imperfections of SiC crstals by X-ray diffraction and electron microscopic techniques |
| 260 | __ | |aVaranasi|bBanaras Hindu University|c1982 |
| 502 | __ | |bPhD |
| 650 | __ | |aPhysics|2UGC |
| 653 | __ | |aPhysics |
| 653 | __ | |aCrystallography |
| 653 | __ | |aDiffraction Methods |
| 700 | __ | |aSingh, G|eGuide |
| 905 | __ | |anotification |
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