Title : Development of new algorithms for test generation and simulation of stuck at faults in logic circuits

Type of Material: Thesis
Title: Development of new algorithms for test generation and simulation of stuck at faults in logic circuits
Researcher: Bhuvaneswari, M C
Guide: Sivanandam, S N
Publisher: Bharathiar University
Place: Coimbatore
Language: English
Dissertation/Thesis Note: PhD
Fulltext: Shodhganga

00000000ntm a2200000ua 4500
001353571
003IN-AhILN
0052018-08-14 06:41:31
008__180814t####||||ii#||||g|m||||||||||eng||
035__|a(IN-AhILN)th_353571
040__|aBRTR_641046|dIN-AhILN
041__|aeng
100__|aBhuvaneswari, M C|eResearcher
245__|aDevelopment of new algorithms for test generation and simulation of stuck at faults in logic circuits
260__|aCoimbatore|bBharathiar University
502__|bPhD
700__|aSivanandam, S N|eGuide
856__|uhttp://shodhganga.inflibnet.ac.in/handle/10603/108818|yShodhganga
905__|anotification

User Feedback Comes Under This section.