| Type of Material: | Thesis |
| Title: | Studies on the radiation induced damages in MOS structures with applications to semiconductor dosimetry |
| Researcher: | Kulkarni Vinodkumar Rajarampanth |
| Guide: | Dhole Sanjay D. Bhoraskar and V. N. |
| Publisher: | Savitribai Phule Pune University |
| Place: | Pune |
| Language: | English |
| Dissertation/Thesis Note: | PhD |
| Fulltext: | Shodhganga |
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| 001 | 338132 | |
| 003 | IN-AhILN | |
| 005 | 2018-08-14 05:34:04 | |
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| 035 | __ | |a(IN-AhILN)th_338132 |
| 040 | __ | |aPUNE_411007|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aKulkarni Vinodkumar Rajarampanth|eResearcher |
| 245 | __ | |aStudies on the radiation induced damages in MOS structures with applications to semiconductor dosimetry |
| 260 | __ | |aPune|bSavitribai Phule Pune University |
| 502 | __ | |bPhD |
| 700 | __ | |aDhole Sanjay D. Bhoraskar and V. N.|eGuide |
| 856 | __ | |uhttp://shodhganga.inflibnet.ac.in/handle/10603/90344|yShodhganga |
| 905 | __ | |anotification |
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