Title : Design and analysis of fault based test compaction methods for combinational circuits

Type of Material: Thesis
Title: Design and analysis of fault based test compaction methods for combinational circuits
Researcher: Thamarai, SM
Guide: Kuppusamy, K
Publisher: Alagappa University
Place: Karaikudi
Language: English
Dissertation/Thesis Note: PhD
Fulltext: Shodhganga

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035__|a(IN-AhILN)th_310390
040__|aALGP_623003|dIN-AhILN
041__|aeng
100__|aThamarai, SM|eResearcher
245__|aDesign and analysis of fault based test compaction methods for combinational circuits
260__|aKaraikudi|bAlagappa University
502__|bPhD
700__|aKuppusamy, K|eGuide
856__|uhttp://shodhganga.inflibnet.ac.in/handle/10603/56360|yShodhganga
905__|anotification

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