| Type of Material: | Thesis |
| Title: | X-ray diffraction profile due to structure defects in some metals and alloys |
| Researcher: | Misra, Nirmal Kumar |
| Department: | Department of Electronics Engineering |
| Publisher: | Indian Institute of Technology |
| Place: | Kharagpur |
| Year: | 1968 |
| Language: | English |
| Subject: | Electricity | Electronics | X and Gamma Rays |
| Dissertation/Thesis Note: | PhD |
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