| Type of Material: | Thesis |
| Title: | Crystallography and theory of X-ray diffraction of stacking faults in the double hexagonal close-packed structure |
| Researcher: | Bhagwati Prasad |
| Department: | Department of Electronics Engineering |
| Publisher: | Banaras Hindu University |
| Place: | Varanasi |
| Year: | 1970 |
| Language: | English |
| Subject: | Electricity | Electronics | X and Gamma Rays |
| Dissertation/Thesis Note: | PhD |
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| 001 | 30356 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 701231t1970||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_30356 |
| 040 | __ | |aBHUL_221005|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aBhagwati Prasad|eResearcher |
| 110 | __ | |aDepartment of Electronics Engineering|bBanaras Hindu University|dVaranasi|eIn |
| 245 | __ | |aCrystallography and theory of X-ray diffraction of stacking faults in the double hexagonal close-packed structure |
| 260 | __ | |aVaranasi|bBanaras Hindu University|c1970 |
| 502 | __ | |bPhD |
| 653 | __ | |aElectricity |
| 653 | __ | |aElectronics |
| 653 | __ | |aX and Gamma Rays |
| 905 | __ | |anotification |
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