| Type of Material: | Thesis |
| Title: | Characterization of latice imperfections in nanocrystalline materials by position annihilation, xray diffraction and other methods |
| Researcher: | Abhijit Banerjee |
| Guide: | Pradhan, Swapan Kr |
| Publisher: | The University of Burdwan |
| Place: | Bardhaman |
| Year: | 2014-08-04 |
| Language: | English |
| Dissertation/Thesis Note: | PhD |
| Fulltext: | Shodhganga |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 284977 | |
| 003 | IN-AhILN | |
| 005 | 2018-08-14 01:41:39 | |
| 008 | __ | 180814t2014||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_284977 |
| 040 | __ | |aBRDN_713104|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aAbhijit Banerjee|eResearcher |
| 245 | __ | |aCharacterization of latice imperfections in nanocrystalline materials by position annihilation, xray diffraction and other methods |
| 260 | __ | |aBardhaman|bThe University of Burdwan|c2014-08-04 |
| 502 | __ | |bPhD |
| 700 | __ | |aPradhan, Swapan Kr|eGuide |
| 856 | __ | |uhttp://shodhganga.inflibnet.ac.in/handle/10603/22084|yShodhganga |
| 905 | __ | |anotification |
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