Title : Analytical characterization of technologically important materials using TXRF and EDXRF

Type of Material: Thesis
Title: Analytical characterization of technologically important materials using TXRF and EDXRF
Researcher: Lenka, Sangita Dhara
Guide: Aggarwal, S K
Department: Department of Chemical Sciences
Publisher: Homi Bhabha National Institute
Place: Mumbai
Year: February, 2012
Language: English
Subject: Chemical sciences
Nuclear energy
Energy dispersive x-ray fluorescence
Nuclear industry
Nuclear fuel
Total reflection x-ray fluorescence
Dissertation/Thesis Note: PhD
Fulltext: Shodhganga

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035__|a(IN-AhILN)th_263065
040__|aHBNI_400088|dIN-AhILN
041__|aeng
100__|aLenka, Sangita Dhara|eResearcher
110__|aDepartment of Chemical Sciences|bHomi Bhabha National Institute|dMumbai
245__|aAnalytical characterization of technologically important materials using TXRF and EDXRF
260__|aMumbai|bHomi Bhabha National Institute|cFebruary, 2012
502__|bPhD
518__|oDate of Notification|d2012-02
653__|aChemical sciences
653__|aNuclear energy
653__|aEnergy dispersive x-ray fluorescence
653__|aNuclear industry
653__|aNuclear fuel
653__|aTotal reflection x-ray fluorescence
700__|aAggarwal, S K|eGuide
856__|uhttp://shodhganga.inflibnet.ac.in/handle/10603/11447|yShodhganga
905__|anotification

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