| Type of Material: | Thesis |
| Title: | Efficient methods and novel approaches for analog electronic circuitEfficient methods and novel approaches for analog electronic circuit fault diagnosis using simulation before test (SBT) approach |
| Researcher: | Rao, S P Venu Madhava |
| Guide: | Lal Kishore, K |
| Department: | Department of Electronics and Communication Engineering |
| Publisher: | Jawaharlal Nehru Technological University |
| Place: | Kukatpally |
| Year: | October, 2011 |
| Language: | English |
| Subject: | Electrical fault | Electronics engineering | Electronics and Communication Engineering |
| Dissertation/Thesis Note: | PhD |
| Fulltext: | Shodhganga |
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| 040 | __ | |aJNTU_500028|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aRao, S P Venu Madhava|eResearcher |
| 110 | __ | |aDepartment of Electronics and Communication Engineering|bJawaharlal Nehru Technological University|dKukatpally |
| 245 | __ | |aEfficient methods and novel approaches for analog electronic circuitEfficient methods and novel approaches for analog electronic circuit fault diagnosis using simulation before test (SBT) approach |
| 260 | __ | |aKukatpally|bJawaharlal Nehru Technological University|cOctober, 2011 |
| 502 | __ | |bPhD |
| 518 | __ | |oDate of Notification|d2011-10 |
| 520 | __ | |aThe fault diagnosis of analog circuits has been a major field of interest in research for the last few decades. The proliferation of large analog circuits and systems of ever increasing complexity has stirred great interest in methods for trouble shooti |
| 650 | __ | |aElectronics and Communication Engineering|2UGC |
| 653 | __ | |aElectrical fault |
| 653 | __ | |aElectronics engineering |
| 700 | __ | |aLal Kishore, K|eGuide |
| 856 | __ | |uhttp://shodhganga.inflibnet.ac.in/handle/10603/4493|yShodhganga |
| 905 | __ | |anotification |
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