| Type of Material: | Thesis |
| Title: | Non-destructive evaluation of ion-implanted semiconductor thin films using Photothermal Deflection Spectroscopy |
| Researcher: | Paulraj, M |
| Guide: | Vijayakumar, K P |
| Department: | Dept. of Physics |
| Publisher: | Cochin University of Science and Technology |
| Place: | Cochin |
| Year: | 30/12/2004 |
| Language: | English |
| Subject: | Physics | Semiconductor physics | Photothermal deflection spectroscopy |
| Dissertation/Thesis Note: | PhD |
| Fulltext: | Shodhganga |
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| 001 | 258865 | |
| 003 | IN-AhILN | |
| 005 | 2013-12-04 12:42:59 | |
| 008 | __ | 111031t2004||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_258865 |
| 040 | __ | |aCUST_682022|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aPaulraj, M|eResearcher |
| 110 | __ | |aDept. of Physics|bCochin University of Science and Technology|dCochin |
| 245 | __ | |aNon-destructive evaluation of ion-implanted semiconductor thin films using Photothermal Deflection Spectroscopy |
| 260 | __ | |aCochin|bCochin University of Science and Technology|c30/12/2004 |
| 502 | __ | |bPhD |
| 518 | __ | |oDate of Notification|d2004-12-30 |
| 653 | __ | |aPhysics |
| 653 | __ | |aSemiconductor physics |
| 653 | __ | |aPhotothermal deflection spectroscopy |
| 700 | __ | |aVijayakumar, K P|eGuide |
| 856 | __ | |uhttp://shodhganga.inflibnet.ac.in/handle/10603/3116|yShodhganga |
| 905 | __ | |anotification |
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