Type of Material: | Thesis |
Title: | Study and exploration of new methods in test pattern vectors and pattern classification design |
Researcher: | Padmaja, V |
Guide: | Rajan, E G | Murali Krishna, I V |
Department: | Department of Electrical Engineering |
Publisher: | Jawaharlal Nehru Technological Uniaversity |
Place: | Hyderabad |
Year: | 2009 |
Language: | English |
Subject: | Electronics Engineering | Electrical Engineering |
Dissertation/Thesis Note: | PhD |
000 | 00000ntm a2200000ua 4500 | |
001 | 239918 | |
003 | IN-AhILN | |
005 | 2011-10-20 11:11:52 | |
008 | __ | 111020t2009||||ii#||||g|m||||||||||eng|| |
035 | __ | |a(IN-AhILN)th_239918 |
040 | __ | |aJNTU_500028|dIN-AhILN |
041 | __ | |aeng |
100 | __ | |aPadmaja, V|eResearcher |
110 | __ | |aDepartment of Electrical Engineering|bJawaharlal Nehru Technological University, Hyderabad|dHyderabad |
245 | __ | |aStudy and exploration of new methods in test pattern vectors and pattern classification design |
260 | __ | |aHyderabad|bJawaharlal Nehru Technological Uniaversity|c2009 |
502 | __ | |bPhD |
650 | __ | |aElectrical Engineering|2UGC |
653 | __ | |aElectronics Engineering |
700 | __ | |aRajan, E G|eGuide |
700 | __ | |aMurali Krishna, I V|eGuide |
905 | __ | |anotification |
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