| Type of Material: | Thesis |
| Title: | Micro and nano indentation studies and atomic force microscopy analysis of apitaxially grown GaN, InGan and SiC |
| Researcher: | Geetha, D |
| Guide: | Arivuoli, D |
| Department: | Department of Physics |
| Publisher: | Anna University |
| Place: | Chennai |
| Year: | 2009 |
| Language: | English |
| Subject: | Physics | Physics |
| Dissertation/Thesis Note: | PhD |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 237279 | |
| 003 | IN-AhILN | |
| 005 | 2011-06-09 10:51:56 | |
| 008 | __ | 110609t2009||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_237279 |
| 040 | __ | |aANNA_600025|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aGeetha, D|eResearcher |
| 110 | __ | |aDepartment of Physics|bAnna University|dChennai |
| 245 | __ | |aMicro and nano indentation studies and atomic force microscopy analysis of apitaxially grown GaN, InGan and SiC |
| 260 | __ | |aChennai|bAnna University|c2009 |
| 502 | __ | |bPhD |
| 650 | __ | |aPhysics|2UGC |
| 653 | __ | |aPhysics |
| 700 | __ | |aArivuoli, D|eGuide |
| 905 | __ | |anotification |
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