Title : Study of gate leakage current in sub 100 nm mosfet with highK gate dielectric stack

Type of Material: Thesis
Title: Study of gate leakage current in sub 100 nm mosfet with highK gate dielectric stack
Researcher: Tyagi, Hitender Kumar
Department: Department of Electronics Engineering
Publisher: Kurukshetra University
Place: Kurukshetra
Year: 2007
Language: English
Subject: Science and Technology
Engineering Sciences
Electronics and Communication Engineering
Accession No: 45(52)
Dissertation/Thesis Note: PhD

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035__|a(IN-AhILN)th_187102
040__|aKRKT_132119|dIN-AhILN
041__|aeng
100__|aTyagi, Hitender Kumar|eResearcher
110__|aDepartment of Electronics Engineering|bKurukshetra University|dKurukshetra
245__|aStudy of gate leakage current in sub 100 nm mosfet with highK gate dielectric stack
260__|aKurukshetra|bKurukshetra University|c2007
502__|bPhD
653__|aScience and Technology
653__|aEngineering Sciences
653__|aElectronics and Communication Engineering
852__|p45(52)
905__|anotification

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