| Type of Material: | Thesis |
| Title: | High resolution X-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals |
| Researcher: | Bhagavannarayana, Godavarthi |
| Guide: | Krishan Lal |
| Department: | Department of Physics and Astrophysics |
| Publisher: | University of Delhi |
| Place: | Delhi |
| Year: | 1994 |
| Language: | English |
| Subject: | Biology |
| Accession No: | Th 0009682%35956 |
| Dissertation/Thesis Note: | PhD |
| 000 | 00000ntm a2200000ua 4500 | |
| 001 | 179827 | |
| 003 | IN-AhILN | |
| 005 | 2011-01-13 00:00:00 | |
| 008 | __ | 071130t1994||||ii#||||g|m||||||||||eng|| |
| 035 | __ | |a(IN-AhILN)th_179827 |
| 040 | __ | |aDELI_110007|dIN-AhILN |
| 041 | __ | |aeng |
| 100 | __ | |aBhagavannarayana, Godavarthi|eResearcher |
| 110 | __ | |aDepartment of Physics and Astrophysics|bUniversity of Delhi|dDelhi |
| 245 | __ | |aHigh resolution X-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals |
| 260 | __ | |aDelhi|bUniversity of Delhi|c1994 |
| 502 | __ | |bPhD |
| 653 | __ | |aBiology |
| 700 | __ | |aKrishan Lal|eGuide |
| 852 | __ | |pTh 0009682%35956 |
| 905 | __ | |anotification |
User Feedback Comes Under This section.