| Type of Material: | Thesis |
| Title: | The effect of built-in drift fields emmitter recombinations, back surface recombinations and high injection on open circuit voltage decay |
| Researcher: | Ray, UC |
| Guide: | Ray, U C |
| Department: | Department of Electrical Engineering |
| Publisher: | University of Delhi |
| Place: | Delhi |
| Year: | 1988 |
| Language: | English |
| Subject: | Electrical Engineering | Electrical Engineering |
| Accession No: | Th 0008420%Th 0009362%36074 |
| Dissertation/Thesis Note: | PhD |
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