Type of Material: | Thesis |
Title: | Materials analysis using X-ray fluorescence technique employing alpha induced windowless x-ray si(li) detector system |
Researcher: | Koshal, Rajesh Kumar |
Department: | Department of Physics |
Publisher: | Kurukshetra University |
Place: | Kurukshetra |
Year: | 1993 |
Language: | English |
Subject: | Physical Sciences | Physics | Physics |
Dissertation/Thesis Note: | PhD |
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001 | 159784 | |
003 | IN-AhILN | |
005 | 2011-01-13 00:00:00 | |
008 | __ | 931231t1993||||ii#||||g|m||||||||||eng|| |
035 | __ | |a(IN-AhILN)th_159784 |
040 | __ | |aKRKT_132119|dIN-AhILN |
041 | __ | |aeng |
100 | __ | |aKoshal, Rajesh Kumar|eResearcher |
110 | __ | |aDepartment of Physics|bKurukshetra University|dKurukshetra|eIn |
245 | __ | |aMaterials analysis using X-ray fluorescence technique employing alpha induced windowless x-ray si(li) detector system |
260 | __ | |aKurukshetra|bKurukshetra University|c1993 |
502 | __ | |bPhD |
650 | __ | |aPhysics|2UGC |
653 | __ | |aPhysical Sciences |
653 | __ | |aPhysics |
905 | __ | |anotification |
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