Title : Materials analysis using X-ray fluorescence technique employing alpha induced windowless x-ray si(li) detector system

Type of Material: Thesis
Title: Materials analysis using X-ray fluorescence technique employing alpha induced windowless x-ray si(li) detector system
Researcher: Koshal, Rajesh Kumar
Department: Department of Physics
Publisher: Kurukshetra University
Place: Kurukshetra
Year: 1993
Language: English
Subject: Physical Sciences
Physics
Physics
Dissertation/Thesis Note: PhD

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035__|a(IN-AhILN)th_159784
040__|aKRKT_132119|dIN-AhILN
041__|aeng
100__|aKoshal, Rajesh Kumar|eResearcher
110__|aDepartment of Physics|bKurukshetra University|dKurukshetra|eIn
245__|aMaterials analysis using X-ray fluorescence technique employing alpha induced windowless x-ray si(li) detector system
260__|aKurukshetra|bKurukshetra University|c1993
502__|bPhD
650__|aPhysics|2UGC
653__|aPhysical Sciences
653__|aPhysics
905__|anotification

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