Title : Study of structural and optical properties of Ga Ge Te and SiSe thin films and their crystallization behaviour on laser and thermal annealing

Type of Material: Thesis
Title: Study of structural and optical properties of Ga Ge Te and SiSe thin films and their crystallization behaviour on laser and thermal annealing
Researcher: Sripathi, Yarasi
Guide: Malhotra, L K
Reddy, G B
Department: Department of Physics
Publisher: Indian Institute of Technology-delhi
Place: New Delhi
Year: 1994
Language: English
Subject: Physical Sciences
Physics
Physics
Dissertation/Thesis Note: PhD

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035__|a(IN-AhILN)th_159266
040__|aIITD_110016|dIN-AhILN
041__|aeng
100__|aSripathi, Yarasi|eResearcher
110__|aDepartment of Physics|bIndian Institute of Technology-delhi|dNew Delhi|eIn
245__|aStudy of structural and optical properties of Ga Ge Te and SiSe thin films and their crystallization behaviour on laser and thermal annealing
260__|aNew Delhi|bIndian Institute of Technology-delhi|c1994
502__|bPhD
650__|aPhysics|2UGC
653__|aPhysical Sciences
653__|aPhysics
700__|aMalhotra, L K|eGuide
700__|aReddy, G B|eGuide
905__|anotification

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