Title : Characterization of vapour deposited thin films by X-ray diffraction methods

Type of Material: Thesis
Title: Characterization of vapour deposited thin films by X-ray diffraction methods
Researcher: Chattopadhyay, Ela
Department: Department of Physics
Publisher: University of Calcutta
Place: Calcutta
Year: 1989
Language: English
Subject: Physics
States of Matter
Solid State
Physics
Dissertation/Thesis Note: PhD

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008__891231t1989||||ii#||||g|m||||||||||eng||
035__|a(IN-AhILN)th_147459
040__|aCLCT_700073|dIN-AhILN
041__|aeng
100__|aChattopadhyay, Ela|eResearcher
110__|aDepartment of Physics|bUniversity of Calcutta|dCalcutta|eIn
245__|aCharacterization of vapour deposited thin films by X-ray diffraction methods
260__|aCalcutta|bUniversity of Calcutta|c1989
502__|bPhD
650__|aPhysics|2UGC
653__|aPhysics
653__|aStates of Matter
653__|aSolid State
905__|anotification

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